Application Scientist SEMI (50488)

Rigaku Semiconductor Metrology Division is seeking an X‐ray Applications Scientist to support Rigaku’s X‐ray metrology products. The position is directed from the corporate office in The Woodlands, Texas. This position will work closely with sales, marketing, and the product development team, and requires up to 20% travel for on‐site applications support, training, and presentations. The candidate must be able to quickly and accurately communicate detailed specifications to customers and the Rigaku Semiconductor Metrology team to assist the sales process.

Responsibilities:

• Provide applications support for Rigaku semiconductor metrology tools utilizing a variety of x-ray analytical techniques, e.g. high-resolution x‐ray diffraction (HR-XRD), x‐ray reflectometry (XRR), x‐ray fluorescence (XRF/TXRF), and small angle x‐ray scattering (SAXS).
• Assist customers remotely and on-site with recipe creation and optimization, tool operation and data analysis. Use expert technical knowledge of x-ray techniques to drive solutions to challenging customer applications.
• Provide support to the Rigaku Service team for new tool installations and perform deep dive analysis to help troubleshoot tool issues as needed.
• Provide support to the Rigaku Sales team to ensure customer satisfaction through all stages of the sales process. Work to understand customer application requirements and objectives, and act as technical lead for product demonstrations.
• Write technical documentation and application notes, and create and maintain training material. Clearly and effectively communicate highly technical subject matter to a variety of audiences.
• Maintain positive, productive work relationships with customers and colleagues at all levels.
• Travel to customer sites located primarily within the United States, but with occasional international trips.
  
  

Qualifications

• Ph.D or M.S. in Material Science, Physics, Chemistry, Solid State, or related engineering fields.
• Minimum of three years of work experience as an applications scientist or applications engineer in a semiconductor metrology tool manufacturer or as a process engineer in a semiconductor device manufacturer with thin film quality control/metrology experience.
• Experience with epitaxial thin film characterization using HR-XRD, including reciprocal space mapping, pole figures, texture analysis, etc.
• Strong understanding of fundamentals of x-ray physics, spectroscopy, diffraction and scattering.
• Strong understanding of semiconductor device manufacturing process.
• Excellent analytical thinking and problem-solving skills, e.g. root cause analysis, 5 Whys.
• Proficient in data analysis techniques and skills, including a working knowledge of statistics and statistical process control.
• Proficient in speaking, reading, and writing in English. Ability to speak at an intermediate level in Japanese, Chinese, Korean, or Hebrew is a plus.
• Excellent written and verbal technical communication skills.
• Ability to travel up to 20% with occasional international travel.
• U.S. Citizenship or U.S. Permanent Resident status required.